Cost and time analysis of probe card configuration during fail die re-probing The Case Study of K Company
碩士 === 國立清華大學 === 工業工程與工程管理學系碩士在職專班 === 100 === Semiconductor test manufacturing services，it is to distinguish IC is good or bad on wafer，the main function of the wafer testing to ensure the quality of wafer fabrication and reduce the cost of the package in assembly，provided best quality for the nex...
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| Format: | Others |
| Language: | zh-TW |
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2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/41672271252394796287 |