Constructing a Data Mining Framework for Semiconductor Yield Enhancement in Ramping-up Advanced Technology
碩士 === 國立清華大學 === 工業工程與工程管理學系 === 100 === Yield enhancement is a critical factor to maintain competitive ability in semiconductor manufacturing. Early identification of the yield-loss causes for ramp-up stage from data analysis in early stage is the key to shorten the time to market. However, the hi...
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| Format: | Others |
| Language: | zh-TW |
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2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/04214689477258190563 |