Location Aware Scan Chain Reordering for Scan Chain Diagnosis
碩士 === 國立清華大學 === 資訊工程學系 === 100 === Because scan chain failure is responsible for a large percentage of yield loss, scan chain diagnosis has become a critical issue in modern technology. In this paper, we present a scan chain reordering algorithm to improve scan chain fault diagnosis resolution. Th...
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| Format: | Others |
| Language: | en_US |
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2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30175292201874347527 |