Feature Identification of Systematic Process Variations with Machine Learning Techniques
碩士 === 國立清華大學 === 電機工程學系 === 100 === As the CMOS technology coming to nano meter scale, process variation play an important role in yield of production. In order to identify variability issues for low yield process, process monitoring circuitry, such as ring oscillators, delay chain, or delay-tes...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2012
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/92652856476539896764 |