Improvement of Electrical Characteristics in MOS Devices with Higher-k Dielectrics and Interfacial Layer by Plasma Treatment

碩士 === 國立清華大學 === 工程與系統科學系 === 100

Bibliographic Details
Main Authors: Hong, Hao-Zhi, 洪晧智
Other Authors: Chang-Liao, Kuei-Shu
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/03979910865620437749