Nano-oxidation of indium tin oxide using a conductive atomic force microscope
碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 100 === In this thesis, we successfully employed nano-oxidation to oxidize the indium tin oxide (ITO) surface using an atomic force microscope (AFM). During the oxidation, a water bridge would be formed automatically between the AFM tip and the ITO substrate. A bias v...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/52488534750960536477 |