Layout Decomposition for Triple Patterning Lithography

碩士 === 國立臺灣大學 === 電子工程學研究所 === 100 === Double patterning lithography (DPL) has been widely recognized as one of the most promising solutions for the sub-22nm technology node to enhance pattern printability. However, much of the literature from industry states that, for the 15nm technology node and b...

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Bibliographic Details
Main Authors: Wei-Yu Chen, 陳威宇
Other Authors: 張耀文
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/12296490883899231236