Machine Vision Applied to Glass Cover Chip Defect Detection and Classification in the Image Sensor Packing Process
碩士 === 國立臺灣科技大學 === 自動化及控制研究所 === 100 === This study focused on the glass cover chip defect detection and classification in the image sensor packing process. Glass cover chip defect detection can be divided into two parts, namely, the non-photoresist zone detection and photoresist zone detection. De...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/31993294189052875234 |