Unipolar Resistive Switching Investigation of ZrO2 and ZrO2-NiO Dielectric Layer

碩士 === 國立臺灣科技大學 === 材料科學與工程系 === 100 === This thesis focuses on the investigation of RRAM (Resistive Switching Random Accessing Memory) using ZrO2 and ZrO2-NiO thin films as dielectric layer and Al as bottom and top electrodes. Performance of the RRAM can be improved by adjusting the amount of oxyge...

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Bibliographic Details
Main Authors: Han-siang Li, 栗漢翔
Other Authors: Shyankay Jou
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/11334396072891422012