Practical Standard Cell Library Optimizer for Improving Rate of Redundant Via Insertion

碩士 === 國立臺灣科技大學 === 電子工程系 === 100 === Via failures are an ongoing challenge in nanometer-scale semiconductor manufacturing processes. Adding redundant vias is the standard method for increasing yield and reliability. Cell-based design approaches are extensively adopted for physical implementation. S...

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Bibliographic Details
Main Authors: Hung-Ming hong, 洪宏銘
Other Authors: Shanq-Jang Ruan
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/98434889340520872768