Usage Cluster Analysis for Filling Methodology of Unknowns for Efficient Compaction
碩士 === 淡江大學 === 電機工程學系碩士在職專班 === 100 === One of IC tester’s problems is the larger and larger test data volume due to the complexity of the circuit design. Furthermore, since the unknown generated during the test procedure is taking a major part of the test data volume and space, it has become...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54584867476921492583 |