Optimal Unknown Bit Filtering for Test Response Masking
碩士 === 淡江大學 === 電機工程學系碩士班 === 100 === With developments of IC testing, LFSR and MISR technologies provide very high compression rate. However, unknown (X) states which decrease the reliability are injected into compactor. Many researches added the X-masking logic (XML) which connects between test re...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/48842266160132602358 |