| Summary: | 碩士 === 淡江大學 === 電機工程學系碩士班 === 100 === With developments of IC testing, LFSR and MISR technologies provide very high compression rate. However, unknown (X) states which decrease the reliability are injected into compactor. Many researches added the X-masking logic (XML) which connects between test response and compactor and prevents multiplication of X states due to their simple feedback circuitry. Further, the XML needs to add extra control codes which make it difficult to improve the efficiency.
This thesis proposed the method, row-column XML, which is a novel combinational circuit. Our method can block the propagation of X and also use less control codes, but it cannot direct generate control codes as XML. So we also provided the generation algorithm of control code which can mask X efficiently and observe more testing faults. Finally, in best case, our experimental results obtains better compression rate than XML about 6.65%.
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