The characterization of conductive atomic force microscopy probe-tips characterization for spin-transfer switching
碩士 === 國立雲林科技大學 === 材料科技研究所 === 100 === Abstract Conducting atomic force microscope (Conducting AFM or CAFM) has been used to measure the magnetization switching induced by spin transfer torque (STT) for nanopillars of magnetic tunnel junctions of one of the methods. This detection method is more si...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/93346866220254163007 |