A Research Using QFD Model with Entropy Method for the Quality Control Evaluation of R&;D Software Development System in Semiconductor Manufacturing
碩士 === 元培科技大學 === 企業管理研究所 === 100 === With the rapid progress on wafer fabrication technology, the width of IC is shortened from micron-scaled level to nano-scaled level, and the device density of IC is more and more large. As wafer fabrication technology upgrades to a higher precision level, the se...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/6t8dt8 |