Test Data Compression Based on Dictionary Grouping
碩士 === 元智大學 === 資訊工程學系 === 100 === Reducing test application time and test data volume are major challenges in SoC design. In this thesis we propose a new dictionary-based test data encoding technique for multi-scan-based designs. To reduce the data volume transferred from ATE to the core under test...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Online Access: | http://ndltd.ncl.edu.tw/handle/93802322827364102840 |