Test Data Compression Based on Dictionary Grouping

碩士 === 元智大學 === 資訊工程學系 === 100 === Reducing test application time and test data volume are major challenges in SoC design. In this thesis we propose a new dictionary-based test data encoding technique for multi-scan-based designs. To reduce the data volume transferred from ATE to the core under test...

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Bibliographic Details
Main Authors: Chih-Chan Chen, 陳志展
Other Authors: 曾王道
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/93802322827364102840