The study of optical properties of patterned sapphire substrate

碩士 === 元智大學 === 先進能源碩士學位學程 === 100 === The optical properties of a series of varying pattern size of the patterned sapphire substrate (PSS) were studied by spectrometer. The pattern size and morphology of PSS was measured by the scanning electron microscopy (SEM), atomic force microscopy (AFM). Acco...

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Bibliographic Details
Main Authors: Chia-Yu Kao, 高嘉佑
Other Authors: 柯文政
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/38939320215298919055