Analysis of Pie zoelectricity of ZnO Nanorod by Atomic Force Microscopy
碩士 === 中原大學 === 物理研究所 === 101 === Abstract ZnO nanorods were grown with the hydrothermal method. Their length, thickness, displacement and piezoelectric voltage under stress were analyzed by atomic force microscopy (AFM), and the piezoelectric coefficient was calculated. The time of growth and rea...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/87616907543297923358 |