The Case Study of Quality Improvement of Reclaim Wafer Manufacturing Processes

碩士 === 明新科技大學 === 工業工程與管理系碩士班 === 103 === As the semiconductor industry moving toward miniaturization and highly technological competitiveness, the demanding production process quality, high yield requirements and shop-floor real-time monitoring become more important than ever. With the demanding pr...

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Bibliographic Details
Main Authors: Lin Chin Wei, 林志煒
Other Authors: 楊昌哲
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/92768683417383670518