The Effects of Applied Strains on the Ag/Sn Interfacial Reactions

碩士 === 國立中興大學 === 化學工程學系所 === 101 === Damages on material are unavoidable in the production process and application of electronic device. One of these damages is mechanical strain which is resulted from the difference between the coefficients of thermal expansion (CTE) of materials. It may affect...

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Bibliographic Details
Main Authors: Yu-Ju Tseng, 曾玉如
Other Authors: Chih-Ming Chen
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/e6garw