Study on slight variation in electrical properties of thin film transistor
碩士 === 國立中興大學 === 光電工程研究所 === 101 === The main purpose of this thesis is to investigate and analyze the mura phenomenon due to the weak electrical variation in the a-Si:H thin film transistor and to provide the solution in process. In the past, we analyzed the electrical characteristic of a-Si:H...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/38832782695587125452 |