Temperature Dependent Micromechanical Testing on the Formation of Cu/Sn Intermetallic Thin Films

碩士 === 國立中興大學 === 精密工程學系所 === 101 === A temperature controlled tensile testing was performed to investigate the influence of external stress on the growth of an interfacial Cu-Sn IMC layer. The test specimens were prepared by depositing 25 μm layers of tin atop of copper substrate using electroplati...

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Bibliographic Details
Main Authors: Fang-Ching Lu, 呂芳慶
Other Authors: 林明澤
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/a8428s