Development of the Mach-Zehnder interferometer system for measuring the thickness and refractive index of transparent material
碩士 === 國立中興大學 === 精密工程學系所 === 101 === People are chasing better manufacturing in precision processing machinery and optical components. It needs more accurate and exact method to measure some quanties, especially in parameter measurements of optical components. For example, there are the refractive...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/50349471454699234404 |