The Interfacial Reactions on Pd/Au-coated and Pd-alloyed Cu wire bonds under reliability tests

碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 101 === In this study, we investigated the effect of Pd distribution on the interfacial reactions for copper wire bonding under reliability tests utilizing SEM and EPMA. From the results of HTST, we can find that the growth rate of IMCs of Pd-alloyed copper wire b...

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Bibliographic Details
Main Authors: Chen-LuYu, 游振祿
Other Authors: Kuo-Chang Lu
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/03960655816078923104