Efficient Test Pattern Determination Method for Capture-Power-Safe AC-Scan Testing
碩士 === 國立成功大學 === 資訊工程學系碩博士班 === 101 === The power required to capture test responses during AC scan-based tests may be excessive, and the resulting large power dissipation can lead to a significant current demand that may cause the IR-drop problem and induce unnecessary yield loss. Many methods hav...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33934290305563056924 |