Voltage-Aware Chip-Level Design for Reliability-driven Pin-Constrained EWOD chips
碩士 === 國立成功大學 === 資訊工程學系碩博士班 === 101 === Electrowetting-on-dielectric (EWOD) chips have become the most promising technology to realize pin-constrained digital microfluidic biochips (PDMFBs). In the design flow of EWOD chips, reliability is a critical challenge as it directly affects execution of bi...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/24672010450992363528 |