New polarization scanning ellipsometry for dynamic characterization in LC cell
碩士 === 國立成功大學 === 機械工程學系碩博士班 === 101 === A dynamic polarization scanning ellipsometry based on the Mueller matrix formulation and Stokes polarimetry is proposed for dynamically extracting the effective ellipsometric parameters of anisotropic material. The effective ellipsometric parameters (Ѱp’p’,...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56269259698143510526 |