Electrical Characterization of HfO2-based Resistive Switching Memory at Nanoscale

碩士 === 國立暨南國際大學 === 電機工程學系 === 101 === Recently, resistive random access memory (RRAM) has drawn more and more attention from researchers. The advantages of RRAM include simple structure, high speed, low voltage operation, low cost, and low energy consumption. The RRAM has been considered as one of...

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Bibliographic Details
Main Authors: Chun-Wei Liao, 廖君瑋
Other Authors: 吳幼麟
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/27048149520329650400