1/f noise in micrometer-sized ITO ultrathin films

碩士 === 國立交通大學 === 物理研究所 === 101 === We discuss low- frequency noise as the annealing temperature and measure temperature changes. We try to explain carriers’ transmission characteristic in ITO films by mobility fluctuation.

Bibliographic Details
Main Authors: Hsu, Wei-Ming, 許惟明
Other Authors: Lin, Juhn-Jong
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/60068275801424192554