1/f noise in micrometer-sized ITO ultrathin films
碩士 === 國立交通大學 === 物理研究所 === 101 === We discuss low- frequency noise as the annealing temperature and measure temperature changes. We try to explain carriers’ transmission characteristic in ITO films by mobility fluctuation.
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ndltd-TW-101NCTU51981992015-10-13T23:10:50Z http://ndltd.ncl.edu.tw/handle/60068275801424192554 1/f noise in micrometer-sized ITO ultrathin films 掺錫氧化銦超薄膜之低頻雜訊研究 Hsu, Wei-Ming 許惟明 碩士 國立交通大學 物理研究所 101 We discuss low- frequency noise as the annealing temperature and measure temperature changes. We try to explain carriers’ transmission characteristic in ITO films by mobility fluctuation. Lin, Juhn-Jong 林志忠 2013 學位論文 ; thesis 55 zh-TW |
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zh-TW |
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Others
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description |
碩士 === 國立交通大學 === 物理研究所 === 101 === We discuss low- frequency noise as the annealing temperature and measure temperature changes. We try to explain carriers’ transmission characteristic in ITO films by mobility fluctuation.
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author2 |
Lin, Juhn-Jong |
author_facet |
Lin, Juhn-Jong Hsu, Wei-Ming 許惟明 |
author |
Hsu, Wei-Ming 許惟明 |
spellingShingle |
Hsu, Wei-Ming 許惟明 1/f noise in micrometer-sized ITO ultrathin films |
author_sort |
Hsu, Wei-Ming |
title |
1/f noise in micrometer-sized ITO ultrathin films |
title_short |
1/f noise in micrometer-sized ITO ultrathin films |
title_full |
1/f noise in micrometer-sized ITO ultrathin films |
title_fullStr |
1/f noise in micrometer-sized ITO ultrathin films |
title_full_unstemmed |
1/f noise in micrometer-sized ITO ultrathin films |
title_sort |
1/f noise in micrometer-sized ito ultrathin films |
publishDate |
2013 |
url |
http://ndltd.ncl.edu.tw/handle/60068275801424192554 |
work_keys_str_mv |
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1718084830571266048 |