An Exponentially Weighted Moving Average Control Chart Based on Likelihood Ratio Test Statistics for Monitoring General Linear Profiles
碩士 === 國立交通大學 === 統計學研究所 === 101 === When the quality of a process can be characterized by general linear profiles, a statistical process control scheme that can be used in industrial practice is proposed in the paper. First, some properties of the likelihood ratio test statistics are introduced. Ne...
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| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91346305035340584134 |