Performance, Manufacturability, and Yield Optimization in Nanometer Design Routing

博士 === 國立交通大學 === 資訊科學與工程研究所 === 101 === As very-large-scale integration (VLSI) designs enter the nano-meter area, many methodologies are introduced to shorten the time-to-market or improve the manufacturability of chips; however, the introduced methodologies bring new issues into the design flow. I...

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Bibliographic Details
Main Authors: Lin, Yen-Hung, 林彥宏
Other Authors: Li, Yih-Lang
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/96693157871309692858