ESD Protection Design for Radio-Frequency Integrated Circuits
碩士 === 國立交通大學 === 電子研究所 === 101 === For the consideration of high integration and low cost, radio-frequency integrated circuits (RF ICs) have been fabricated in CMOS processes. Electrostatic discharge (ESD) is one of the most serious reliability issues of CMOS processes, and it also bothers RF IC de...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27794458231011003592 |