Single photon avalanche diode with low dark count rate in standard CMOS technology
碩士 === 國立交通大學 === 電子研究所 === 101 === In this thesis, we propose and demonstrate a device structure of low dark-count-rate (DCR) single photon detector. To avoid the breakdown events triggered by the trap of shallow trench isolation (STI) in the active region, we design a guard-ring structure to keep...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/34124984127248225111 |