Investigation of the Mechanism and Reliability of a U-Shaped MTP SONOS Flash Memory Cell by a CMOS Logic Process

碩士 === 國立交通大學 === 電子研究所 === 101 === SONOS Memory has recently received much more attention because of its simplicity in structure, process, and scalable by comparing with conventional floating gate cells. Nowadays, the requirements of flash memory, low voltage operation, low power consumption, and...

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Bibliographic Details
Main Authors: Tsai, Cheng-Ta, 蔡政達
Other Authors: Chung, Steve S.
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/22263744796655288086