Effects of InAs Quantum dots on Schottky Diodes and Field Effect Transistors

碩士 === 國立交通大學 === 電子工程學系 電子研究所 === 101 === This thesis present the study on how charge capturing/escaping of quantum dot (QD) layers affects measured the electrical characteristics of Schottky diodes and field effect transistors (FETs). For the Schottky diodes with QDs, the current-voltage (I-V) cur...

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Bibliographic Details
Main Authors: Wang, Tsan-Hao, 王參豪
Other Authors: Lin, Sheng-Di
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/00569942333525955656