Investigation of Trapped Charge Distribution and Reliability Issues in Non-Volatile Flash Memory Devices
博士 === 國立交通大學 === 電信工程研究所 === 101 === This thesis investigates the trapped charge distribution and reliability issues in non-volatile flash memory devices. It consists of two research topics: one is the study of trapped charge distribution in p-channel SONOS memory device using dynamic programming s...
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| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/10752800931603553880 |