Measurement of Electrical Characteristics and Device Uniformity Selection of GaN
碩士 === 國立交通大學 === 機械工程系所 === 101 === In this study, designing the circuit to measurement electrical charateristics of EPC2010 and MOSFET in priority, including ID-VD curve, parasitic capacitance, threshold voltage, breakdown voltage, and body diode, etc. When the results matches the datasheet, measu...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/19491691238640478596 |