Low temperature testing system for IC chips
碩士 === 國立交通大學 === 電機學院電機與控制學程 === 101 === This thesis is to design an IC chip can be tested at low temperatures , the use of the classification of the existing semiconductor testing machines Handler, transformed into a low temperature environment can be tested, then calculate and derive the low-temp...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/01954834588615482126 |