Measurement of reflectance anisotropy spectroscopy of semiconductor by using twisted nematic liquid crystals
碩士 === 國立中山大學 === 物理學系研究所 === 101 === Semiconductors of （1-100） face ZnO with Wurtzite structure aren’t symmetric in two axes which are perpendicular or parallel to c-axis. This provides an optical technique to measure properties of ZnO sample. Reflectance anisotropy spectroscopy (RAS) is an importa...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/74331079453393837588 |