Measurement of reflectance anisotropy spectroscopy of semiconductor by using twisted nematic liquid crystals

碩士 === 國立中山大學 === 物理學系研究所 === 101 === Semiconductors of (1-100) face ZnO with Wurtzite structure aren’t symmetric in two axes which are perpendicular or parallel to c-axis. This provides an optical technique to measure properties of ZnO sample. Reflectance anisotropy spectroscopy (RAS) is an importa...

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Bibliographic Details
Main Authors: Meng-Shao Hsieh, 謝孟劭
Other Authors: Dong Po Wang
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/74331079453393837588