Investigation of Probing E-Field inside the thin-film ZnO on Al2O3 Substrate Using X-ray Multiple Diffraction
碩士 === 國立清華大學 === 物理系 === 101 === 因申請專利緣故,資料延後公開
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Language: | zh-TW |
Published: |
2013
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Online Access: | http://ndltd.ncl.edu.tw/handle/ytjb37 |