Investigation of Probing E-Field inside the thin-film ZnO on Al2O3 Substrate Using X-ray Multiple Diffraction

Investigation of Probing E-Field inside the thin-film ZnO on Al2O3 Substrate Using X-ray Multiple Diffraction

碩士 === 國立清華大學 === 物理系 === 101 === 因申請專利緣故，資料延後公開

Bibliographic Details
Main Author: 葉雅王亭
Other Authors: 張石麟
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/ytjb37
Description
Summary:碩士 === 國立清華大學 === 物理系 === 101 === 因申請專利緣故，資料延後公開

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