Acceleration Factor Analysis of Aging Test for High Power Light Emitting Diodes
碩士 === 國立清華大學 === 動力機械工程學系 === 101 === Due to the effect of global warming, light emitting diodes (LEDs) have become more and more popular in recent years with its advantages like low pollution, low power consumption, long operation lifetime and so on. However, the reliability test standard, IES LM-...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/50266382409588799709 |