Testing and Yield Enhancement Methods for Nonvolatile Random Access Memories

博士 === 國立清華大學 === 電機工程學系 === 101 === This thesis presents the test and yield enhancement associated works for the emerging nonvolatile random access memories (RAMs), specifically the Magnetic Random Access Memory (MRAM) and Resistive Random Access Memory (RRAM). We first address MRAM, which is an em...

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Bibliographic Details
Main Authors: Chen, Ching-Yi, 陳靜怡
Other Authors: Wu, Cheng-Wen
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/07566695299947299176