Study of Crystalline High- k Materials Combined With Rare-Earth Oxide Interfacial Layer as the Gate Dielectric for Ge MOS Capacitors

碩士 === 國立清華大學 === 工程與系統科學系 === 101

Bibliographic Details
Main Author: 趙俊彥
Other Authors: 巫勇賢
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/86890772763888071886