To Increase Burn-in Temperature in Accelerated Life Tests – Some Case Studies on PMIC
碩士 === 國立臺灣海洋大學 === 電機工程學系 === 101 === In this research, there are two ways to estimate the Reliability on the IC products, first source was using the sampling project on the chart " MIL-S-1955 LTPD (Lot Tolerance Percent Defective) and the second source was the suggesting life span method in t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/g9z986 |