Design and Development of Bi-modal Magnetic Stimulation Device for Atomic Force Microscope in Liquid
碩士 === 國立臺灣大學 === 機械工程學研究所 === 101 === Atomic force microscopy (AFM) has been widely used to investigate structures and mechanical properties of materials on surfaces. Static force mode and tapping mode are two most used operation modes. For operating in static force mode, the AFM tip tends to damag...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/46199881686633769468 |