Thermal Fatigue Life and Reliability Evaluation of Die Attachment Layer of High-Power LED under Thermal Cycling Conditions

碩士 === 國立臺灣大學 === 機械工程學研究所 === 101 === Power conservation is a very important aspect of modern day technology, and with its long life and low energy consumption, the High Power Light Emitting Diode has become very popular for lighting purposes. Thermal management plays a key role in the reliability...

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Bibliographic Details
Main Authors: Shih-Lin Lai, 賴世霖
Other Authors: Wen-Fang Wu
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/76285349863979589743