Measurement of Light Emitting Diodes grown on Pattern Sapphire Substrate by Optical Microscopy

碩士 === 國立臺灣科技大學 === 光電工程研究所 === 101 === In general, the light emitting diodes (LEDs) are discussed its luminous quality by the variation of external light of LED. We use optical microscopy in combination of high magnification objective lens to focus on the internal regions of LED to investigate the...

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Bibliographic Details
Main Authors: Yi-Hsuan Huang, 黃翊軒
Other Authors: Jung-Chieh Su
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/33764673365940575545