Measurement of Light Emitting Diodes grown on Pattern Sapphire Substrate by Optical Microscopy
碩士 === 國立臺灣科技大學 === 光電工程研究所 === 101 === In general, the light emitting diodes (LEDs) are discussed its luminous quality by the variation of external light of LED. We use optical microscopy in combination of high magnification objective lens to focus on the internal regions of LED to investigate the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33764673365940575545 |