Accelerated test and life prediction study for Light-emitting diodes
碩士 === 亞東技術學院 === 應用科技研究所 === 102 === Because the upsurge of the electric needs as well as the requirements of environmental consciousness, designing high-efficiency light-emitting diodes (LEDs) become more and more important. Accelerated life testing (ALT) is a frequent used method for acquiring...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91765213859703418309 |